Microstructural and Structural Analysis: A Question of Contrast
With Axio Vert.A1 you examine large, heavy samples, using a wide range of classic and advanced contrast methods. Switch easily between brightfield, darkfield, DIC, C-DIC, fluorescence and polarization contrast in reflected light. In transmitted light, use brightfield, polarization and phase contrast. Or combine several contrast methods for the maximum amount of information.
The 5x encoded nosepiece turret recognizes a change of objectives automatically. It also enables the use of a light manager to save and recover light intensity values. You quantify your structure efficiently, evaluate the properties and quality of your materials. Gain valuable new understanding and optimize preparation or production processes. And then take appropriate measures.
This product has been assigned by the exhibitor to category:
METROLOGY AND QUALITY CONTROL / MEASURING / MEASURING SYSTEMS AND INSTRUMENTS
This product is presented by the exhibitor: CARL ZEISS IBERIA S.L.
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