Waveline Surfscan
Waveline Surfscan - Presente en feria

Roughness and contour measurement rolled into one
• Consistently high resolution over the entire measuring range using a high-resolution digital scale
• Also possible to measure surface roughness on curved and sloped surfaces
• Time-consuming alignment of the reference plane is no longer necessary when measuring roughness
• With a vertical measuring range of 6/12 mm (depending on probe arm length), a variety of contour measuring tasks can be performed simultaneously

Este producto ha sido asignado por el expositor a la categoría:
METROLOGIA Y CONTROL DE CALIDAD / INSTRUMENTOS DE MEDIDA / SISTEMAS E INSTRUMENTOS DE MEDIDA

Este producto es presentado por el expositor: JENOPTIK INDUSTRIAL METROLOGY FRANCE S.A. SUCURSAL EN ESPAÑA

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